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Extreme Solarization Resistant Reflection/Backscatter Probes

Khác HF Corp

Overview

 

A reflection/backscatter probe is a compact, versatile sampling option to measure diffuse and specular reflectance, backscatter, or fluorescence from samples as varied as solids, solutions, and powders. Reflection and backscatter measurements can provide quantitative information about the color, appearance, and chemical composition of a sample.

 

 

  • General purpose -- Ideal for diffuse or specular reflectance from solids; fluorescence; color
  • XSR fibers -- Probe assembly comprises extreme solarization-resistant fibers (180-800 nm)
  • Probe design -- 6-around-1 fiber bundle design, with 6-fiber leg connecting to light source and single-fiber leg connecting to spectrometer

 

 

 

Fiber Core Size

230um, 450um

Jacket

Silicone-coated steel monocoil

Length

2m

Probe Ferrule Diameter

6.35 mm (1/4″)

Wavelength Range

180nm - 800nm

 

 

 

Model

Fiber Core Size

Jacket

Length

Probe Ferrule Diameter

Wavelength Range

QR230-7-XSR

230um

Silicone-coated steel monocoil

2m

6.35 mm (1/4″)

180nm - 800nm
Extreme Solarization Resistant Reflection/Backscatter Probe

QR450-7-XSR

450um

Silicone-coated steel monocoil

2m

6.35 mm (1/4″)

180nm - 800nm
Extreme Solarization Resistant Reflection/Backscatter Probe